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Sensitivity of two beam transmission electron microscope images to the structure of small crystal defects (1981)

Author: Sykes, Lawrence Joseph
Subject: Transmission electron microscopes; Electron microscopy; Crystals
Language: English
Call number: 297676
Digitizing sponsor: University of Florida, George A. Smathers Libraries with support from Lyrasis and the Sloan Foundation
Book contributor: University of Florida, George A. Smathers Libraries
Collection: UFRDS; univ_florida_smathers; americana

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Thesis (Ph. D.) --University of Florida, 1981

Vita

Bibliography: leaves 220-224

MATERIALS SCIENCE AND ENGINEERING Ph. D

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